High strain point aluminosilicate glasses

ABSTRACT

Described herein are alkali-free, boroalumino silicate glasses exhibiting desirable physical and chemical properties for use as substrates in flat panel display devices, such as, active matrix liquid crystal displays (AMLCDs) and active matrix organic light emitting diode displays (AMOLEDs). In accordance with certain of its aspects, the glasses possess good dimensional stability as a function of temperature.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation application and claims the benefit of priority of U.S. patent application Ser. No. 13/777,641 filed on Feb. 26, 2013, now U.S. Pat. No. 9,162,919 which claims the benefit of priority under 35 U.S.C. §119 of U.S. Provisional Application Ser. No. 61/604,249 filed on Feb. 28, 2012, and U.S. Provisional Application Ser. No. 61/676,539 filed on Jul. 27, 2012, both applications being incorporated herein by reference.

BACKGROUND

The production of liquid crystal displays, for example, active matrix liquid crystal display devices (AMLCDs) is very complex, and the properties of the substrate glass are extremely important. First and foremost, the glass substrates used in the production of AMLCD devices need to have their physical dimensions tightly controlled. The downdraw sheet drawing processes and, in particular, the fusion process described in U.S. Pat. Nos. 3,338,696 and 3,682,609, both to Dockerty, are capable of producing glass sheets that can be used as substrates without requiring costly post-forming finishing operations such as lapping and polishing. Unfortunately, the fusion process places rather severe restrictions on the glass properties, which require relatively high liquidus viscosities.

In the liquid crystal display field, thin film transistors (TFTs) based on poly-crystalline silicon are preferred because of their ability to transport electrons more effectively. Poly-crystalline based silicon transistors (p-Si) are characterized as having a higher mobility than those based on amorphous-silicon based transistors (a-Si). This allows the manufacture of smaller and faster transistors, which ultimately produces brighter and faster displays. One problem with p-Si based transistors is that their manufacture requires higher process temperatures than those employed in the manufacture of a-Si transistors. These temperatures range from 450° C. to 600° C. compared to the 350° C. peak temperatures typically employed in the manufacture of a-Si transistors. At these temperatures, most AMLCD glass substrates undergo a process known as compaction. Compaction, also referred to as thermal stability or dimensional change, is an irreversible dimensional change (shrinkage) in the glass substrate due to changes in the glass' fictive temperature. “Fictive temperature” is a concept used to indicate the structural state of a glass. Glass that is cooled quickly from a high temperature is said to have a higher fictive temperature because of the “frozen in” higher temperature structure. Glass that is cooled more slowly, or that is annealed by holding for a time near its annealing point, is said to have a lower fictive temperature.

The magnitude of compaction depends both on the process by which a glass is made and the viscoelastic properties of the glass. In the float process for producing sheet products from glass, the glass sheet is cooled relatively slowly from the melt and, thus, “freezes in” a comparatively low temperature structure into the glass. The fusion process, by contrast, results in very rapid quenching of the glass sheet from the melt, and freezes in a comparatively high temperature structure. As a result, a glass produced by the float process may undergo less compaction when compared to glass produced by the fusion process, since the driving force for compaction is the difference between the fictive temperature and the process temperature experienced by the glass during compaction. Thus, it would be desirable to minimize the level of compaction in a glass substrate that is produced by a downdraw process.

There are two approaches to minimize compaction in glass. The first is to thermally pretreat the glass to create a fictive temperature similar to the one the glass will experience during the p-Si TFT manufacture. There are several difficulties with this approach. First, the multiple heating steps employed during the p-Si TFT manufacture create slightly different fictive temperatures in the glass that cannot be fully compensated for by this pretreatment. Second, the thermal stability of the glass becomes closely linked to the details of the p-Si TFT manufacture, which could mean different pretreatments for different end-users. Finally, pretreatment adds to processing costs and complexity.

Another approach is to slow the rate of strain at the process temperature by increasing the viscosity of the glass. This can be accomplished by raising the viscosity of the glass. The annealing point represents the temperature corresponding to a fixed viscosity for a glass, and thus an increase in annealing point equates to an increase in viscosity at fixed temperature. The challenge with this approach, however, is the production of high annealing point glass that is cost effective. The main factors impacting cost are defects and asset lifetime. In a modern continuous unit (CU) melter comprising a refractory premelt, a precious metal finer and a precious metal glass delivery stem—coupled to a fusion draw machine, four types of defects are commonly encountered: (1) gaseous inclusions (bubbles or blisters); (2) solid inclusions from refractories or from failure to properly melt the batch; (3) metallic defects consisting largely of platinum; and (4) devitrification products resulting from low liquidus viscosity or excessive devitrification at either end of the isopipe. Glass composition has a disproportionate impact on the rate of melting, and hence on the tendency of a glass to form gaseous or solid defects, and the oxidation state of the glass impacts the tendency to incorporate platinum defects. Devitrification of the glass on the forming mandrel, or isopipe, is best managed by selecting compositions with high liquidus viscosities.

Asset lifetime is determined mostly by the rate of wear or deformation of the various refractory and precious metal components of the melting and forming systems. Recent advances in refractory materials, platinum system design, and isopipe refractories have offered the potential to greatly extend the useful operational lifetime of a CU melter coupled to a fusion draw machine. As a result, the lifetime-limiting component of a modern fusion draw melting and forming platform is the electrodes used to heat the glass. Tin oxide electrodes corrode slowly over time, and the rate of corrosion is strong function both of temperature and glass composition. To maximize asset lifetime, it is desirable to identify compositions that reduce the rate of electrode corrosion while maintaining the defect-limiting attributes described above.

SUMMARY

In accordance with the purposes of the disclosed materials, compounds, compositions, articles, devices, and methods, as embodied and broadly described herein are alkali-free, boroalumino silicate glasses exhibiting desirable physical and chemical properties for use as substrates in flat panel display devices, such as, active matrix liquid crystal displays (AMLCDs) and active matrix organic light emitting diode displays (AMOLEDs). In accordance with certain of its aspects, the glasses possess high annealing points and, thus, good dimensional stability (i.e., low compaction). Additionally, the disclosed compositions have very high liquidus viscosities, thus reducing or eliminating the likelihood of devitrification on the forming mandrel. As a result of specific details of their composition, the disclosed glasses melt to good quality with very low levels of gaseous inclusions, and with minimal erosion to precious metals, refractories, and tin oxide electrode materials. Additional advantages will be set forth in part in the description that follows, and in part will be obvious from the description, or may be learned by practice of the aspects described below. The advantages described below will be realized and attained by means of the elements and combinations particularly pointed out in the appended claims. It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive.

BRIEF DESCRIPTION OF THE DRAWINGS

The accompanying figures, which are incorporated in and constitute a part of this specification, illustrate several aspects described below.

FIG. 1 is a schematic representation of a isopipe, the forming mandrel used to make precision sheet in the fusion draw process.

FIG. 2 is a cross section of the isopipe of FIG. 1 at section line 6.

FIG. 3 shows spectra for 1200° and 1140° C. blackbodies and the transmission spectrum of 0.7 mm thick Eagle XG® amorphous thin-film transistor substrate.

DETAILED DESCRIPTION

Described herein are glasses that are substantially free of alkalis that possess high annealing points and, thus, good dimensional stability (i.e., low compaction) for use as TFT backplane substrates in amorphous silicon, oxide and low-temperature polysilicon TFT processes. A high annealing point glass can prevent panel distortion due to compaction/shrinkage during thermal processing subsequent to manufacturing of the glass. The disclosed glasses also possess unusually high liquidus viscosity, and thus a significantly reduced risk to devitrification at cold places in the forming apparatus. It is to be understood that while low alkali concentrations are generally desirable, in practice it may be difficult or impossible to economically manufacture glasses that are entirely free of alkalis. The alkalis in question arise as contaminants in raw materials, as minor components in refractories, etc., and can be very difficult to eliminate entirely. Therefore, the disclosed glasses are considered substantially free of alkalis if the total concentration of the alkali elements Li₂O, Na₂O, and K₂O is less than about 0.1 mole percent (mol %).

In one aspect, the substantially alkali-free glasses have annealing points greater than about 765° C., preferably greater than 775° C., and more preferably greater than 785° C. Such high annealing points result in low rates of relaxation—and hence comparatively small amounts of dimensional change—for the disclosed glass to be used as backplane substrate in a low-temperature polysilicon process. In another aspect, the temperature of the disclosed glasses at a viscosity of about 35,000 poise (T_(35k)) is less than about 1310° C. The liquidus temperature of a glass (T_(liq)) is the highest temperature above which no crystalline phases can coexist in equilibrium with the glass. In another aspect, the viscosity corresponding to the liquidus temperature of the glass is greater than about 150,000 poise, more preferably greater than 200,000 poise, and most preferably greater than 250,000 poise. In another aspect, the disclosed glass is characterized in that T_(35k)−T_(liq)>0.25 T_(35k)−225° C. This ensures minimum tendency to devitrify on the forming mandrel of the fusion process.

In one aspect, the substantially alkali-free glass comprises in mole percent on an oxide basis:

-   -   SiO₂ 69-72.5     -   Al₂O₃ 11-13.5     -   B₂O₃ 1-5     -   MgO 3-5     -   CaO 4-6.5     -   SrO 0-3     -   BaO 1.5-5

wherein 1.05≦(MgO+CaO+SrO+BaO)/Al₂O₃≦1.4, where Al₂O₃, MgO, CaO, SrO, BaO represent the mole percents of the respective oxide components.

In a further aspect, the substantially alkali-free glass comprises in mole percent on an oxide basis:

-   -   SiO₂ 69-72.5     -   Al₂O₃ 11.5-13.5     -   B₂O₃ 1-4.5     -   MgO 3-5     -   CaO 4-6.5     -   SrO 0-3     -   BaO 1.5-5

wherein 1.05≦(MgO+CaO+SrO+BaO)/Al₂O₃≦1.4,

and 0.2≦MgO/(MgO+CaO+SrO+BaO)≦0.35, where Al₂O₃, MgO, CaO, SrO, BaO represent the mole percents of the respective oxide components.

In a further aspect, the substantially alkali-free glass comprises in mole percent on an oxide basis:

-   -   SiO₂ 69-72.5     -   Al₂O₃ 11.5-13.5     -   B₂O₃ 1-4.5     -   MgO 3-5     -   CaO 4-6.5     -   SrO 0-3     -   BaO 1.5-5

wherein 1.05≦(MgO+CaO+SrO+BaO)/Al₂O₃≦1.4

and 0.65≦(CaO+SrO+BaO)/Al₂O₃≦0.95,

where Al₂O₃, MgO, CaO, SrO, BaO represent the mole percents of the respective oxide components.

In one aspect, the disclosed glass includes a chemical fining agent. Such fining agents include, but are not limited to, SnO₂, As₂O₃, Sb₂O₃, F, Cl and Br, and in which the concentrations of the chemical fining agents are kept at a level of 0.5 mol % or less. Chemical fining agents may also include CeO₂, Fe₂O₃, and other oxides of transition metals, such as MnO₂. These oxides may introduce color to the glass via visible absorptions in their final valence state(s) in the glass, and thus their concentration is preferably kept at a level of 0.2 mol % or less.

In one aspect, the disclosed glasses are manufactured into sheet via the fusion process. The fusion draw process results in a pristine, fire-polished glass surface that reduces surface-mediated distortion to high resolution TFT backplanes and color filters. FIG. 1 is a schematic drawing of the fusion draw process at the position of the forming mandrel, or isopipe, so called because its gradient trough design produces the same (hence “iso”) flow at all points along the length of the isopipe (from left to right). FIG. 2 is a schematic cross-section of the isopipe near position 6 in FIG. 1. Glass is introduced from the inlet 1, flows along the bottom of the trough 2 formed by the weir walls 3 to the compression end 4. Glass overflows the weir walls 4 on either side of the isopipe (see FIG. 2), and the two streams of glass join or fuse at the root 6. Edge directors 7 at either end of the isopipe serve to cool the glass and create a thicker strip at the edge called a bead. The bead is pulled down by pulling rolls, hence enabling sheet formation at high viscosity. By adjusting the rate at which sheet is pulled off the isopipe, it is possible to use the fusion draw process to produce a very wide range of thicknesses at a fixed melting rate.

The downdraw sheet drawing processes and, in particular, the fusion process described in U.S. Pat. Nos. 3,338,696 and 3,682,609 (both to Dockerty), which are incorporated by reference, can be used herein. Compared to other forming processes, such as the float process, the fusion process is preferred for several reasons. First, glass substrates made from the fusion process do not require polishing. Current glass substrate polishing is capable of producing glass substrates having an average surface roughness greater than about 0.5 nm (Ra), as measured by atomic force microscopy. The glass substrates produced by the fusion process have an average surface roughness as measured by atomic force microscopy of less than 0.5 nm. The substrates also have an average internal stress as measured by optical retardation which is less than or equal to 150 psi.

In one aspect, the disclosed glasses are manufactured into sheet form using the fusion process. While the disclosed glasses are compatible with the fusion process, they may also be manufactured into sheets or other ware through less demanding manufacturing processes. Such processes include slot draw, float, rolling, and other sheet-forming processes known to those skilled in the art.

Relative to these alternative methods for creating sheets of glass, the fusion process as discussed above is capable of creating very thin, very flat, very uniform sheets with a pristine surface. Slot draw also can result in a pristine surface, but due to change in orifice shape over time, accumulation of volatile debris at the orifice-glass interface, and the challenge of creating an orifice to deliver truly flat glass, the dimensional uniformity and surface quality of slot-drawn glass are generally inferior to fusion-drawn glass. The float process is capable of delivering very large, uniform sheets, but the surface is substantially compromised by contact with the float bath on one side, and by exposure to condensation products from the float bath on the other side. This means that float glass must be polished for use in high performance display applications.

Unfortunately, and in unlike the float process, the fusion process results in rapid cooling of the glass from high temperature, and this results in a high fictive temperature T_(f): the fictive temperature can be thought of as representing the discrepancy between the structural state of the glass and the state it would assume if fully relaxed at the temperature of interest. We consider now the consequences of reheating a glass with a glass transition temperature T_(g) to a process temperature T_(p) such that T_(p)<T_(g)≦T_(f). Since T_(p)<T_(f), the structural state of the glass is out of equilibrium at T_(p), and the glass will spontaneously relax toward a structural state that is in equilibrium at T_(p). The rate of this relaxation scales inversely with the effective viscosity of the glass at T_(p), such that high viscosity results in a slow rate of relaxation, and a low viscosity results in a fast rate of relaxation. The effective viscosity varies inversely with the fictive temperature of the glass, such that a low fictive temperature results in a high viscosity, and a high fictive temperature results in a comparatively low viscosity. Therefore, the rate of relaxation at T_(p) scales directly with the fictive temperature of the glass. A process that introduces a high fictive temperature results in a comparatively high rate of relaxation when the glass is reheated at T_(p).

One means to reduce the rate of relaxation at T_(p) is to increase the viscosity of the glass at that temperature. The annealing point of a glass represents the temperature at which the glass has a viscosity of 10^(13.2) poise. As temperature decreases below the annealing point, the viscosity of the supercooled melt increases. At a fixed temperature below T_(g), a glass with a higher annealing point has a higher viscosity than a glass with a lower annealing point. Therefore, to increase the viscosity of a substrate glass at T_(p), one might choose to increase its annealing point. Unfortunately, it is generally the case that the composition changes necessary to increase the annealing point also increase viscosity at all other temperature. In particular, the fictive temperature of a glass made by the fusion process corresponds to a viscosity of about 10¹¹-10¹² poise, so an increase in annealing point for a fusion-compatible glass generally increases its fictive temperature as well. For a given glass, higher fictive temperature results in lower viscosity at temperature below T_(g), and thus increasing fictive temperature works against the viscosity increase that would otherwise be obtained by increasing the annealing point. To see a substantial change in the rate of relaxation at T_(p), it is generally necessary to make relatively large changes in annealing point. An aspect of the disclosed glass is that it has an annealing point greater than about 765° C., more preferably greater than 775° C., and most preferably greater than 785° C. Such high annealing points results in acceptably low rates of thermal relaxation during low-temperature TFT processing, e.g., typical low-temperature polysilicon rapid thermal anneal cycles.

In addition to its impact on fictive temperature, increasing annealing point also increases temperatures throughout the melting and forming system, particularly the temperatures on the isopipe. For example, Eagle XG® and Lotus™ (Corning Incorporated, Corning, N.Y.) have annealing points that differ by about 50° C., and the temperature at which they are delivered to the isopipe also differ by about 50° C. When held for extended periods of time above about 1310° C., zircon refractory shows thermal creep, and this can be accelerated by the weight of the isopipe itself plus the weight of the glass on the isopipe. A second aspect of the disclosed glasses is that their delivery temperatures are less than 1310° C. Such delivery temperatures permit extended manufacturing campaigns without replacing the isopipe.

In manufacturing trials of glasses with high annealing points and delivery temperatures below 1310° C., it was discovered that they showed a greater tendency toward devitrification on the root of the isopipe and—especially—the edge directors relative to glasses with lower annealing points. Careful measurement of the temperature profile on the isoipe showed that the edge director temperatures were much lower relative to the center root temperature than had been anticipated due to radiative heat loss. The edge directors typically must be maintained at a temperature below the center root temperature in order to ensure that the glass is viscous enough as it leaves the root that it puts the sheet in between the edge directors under tension, thus maintaining a flat shape. As they are at either end of the isopipe, the edge directors are difficult to heat, and thus the temperature difference between the center of the root and the edge directors may differ by 50° or more.

While not wishing to be held to theory, this increased tendency toward devitirication in the fusion process can be understood in terms of the radiative heat loss of glass as a function of temperature. Fusion is substantially an isothermal process, so glass exits the inlet at a particular viscosity and exits the root at a much higher viscosity, but the actual values for the viscosity are not strongly dependent on the identity of the glass or the temperature of the process. Thus, a glass with a higher annealing point generally requires much higher isopipe temperatures that a glass with a lower annealing point just to match the delivery and exit viscosities. As an example, FIG. 3 shows blackbody spectra corresponding to 1140° C. and 1200° C., approximately the temperature at the root of the isopipe (6 in FIG. 2) for Eagle XG® and Lotus™, respectively. The vertical line at about 2.5 μm corresponds approximately with the start of the infrared cut-off, the region in the near infrared through which optical absorption in a borosilicate glass rises very steeply to a high, nearly constant value. At wavelengths shorter than the cut-off wavelength, a glass is sensibly transparent to a wavelength between 300 and 400 nm the UV cut-off. Between about 300 and about 2.5 μm, the 1200° C. blackbody has a greater absolute energy, and a larger fraction of its total energy than the 1140° C. blackbody. Since the glass is sensibly transparent through this wavelength range, the radiative heat loss from a glass at 1200° C. is much greater than that of a glass at 1140° C.

Since radiative heat loss increases with temperature, and since high annealing point glasses generally are formed at higher temperatures than lower annealing point glasses, the temperature difference between the center root and the edge director generally increases with the annealing point of the glass. This has a direct consequence as regards the tendency of a glass to form devitrification products on the isopipe or edge directors. The liquidus temperature of a glass is defined as the highest temperature at which a crystalline phase would appear if a glass were held indefinitely at that temperature. The liquidus viscosity is the viscosity of a glass at the liquidus temperature. To completely avoid devitrification on an isopipe, it is desirable that the liquidus viscosity be high enough to ensure that glass is no longer on the isopipe refractory or edge director material at or near the liquidus temperature.

In practice, few alkali-free glasses have liquidus viscosities of the desired magnitude. Experience with substrate glasses suitable for amorphous silicon applications (e.g., Eagle XG®) indicated that edge directors could be held continuously at temperatures up to 60° below the liquidus temperature of certain alkali-free glasses. While it was understood that glasses with higher annealing points would require higher forming temperatures, it was not anticipated that the edge directors would be so much cooler relative to the center root temperature. A useful metric for keeping track of this effect is the difference between the delivery temperature onto the isopipe and the liquidus temperature of the glass, T_(liq). In the fusion process, it is generally desirable to deliver glass at about 35,000 poise, and the temperature corresponding to a viscosity of 35,000 poise is conveniently represented as T_(35k). For a particular delivery temperature, it is always desirable to make T_(35k)−T_(liq) as large possible, but for an amorphous silicon substrate such as Eagle XG®, it is found that extended manufacturing campaigns can be conducted if T_(35k)−T_(liq) is about 80° or more. As temperature increases, T_(35k)−T_(liq) must increase as well, such that for T_(35k) near 1300°, it is desirable that T_(35k)−T_(liq) at least about 100°. The minimum useful value for T_(35k)−T_(liq) varies approximately linearly with temperature from about 1200° C. to about 1320° C., and can be expressed as minimum T _(35k) −T _(liq)=0.25T _(35k)−225,  (1) where all temperatures are in ° C. Thus, a further aspect of the disclosed glass is that T_(35k)−T_(liq)>0.25T_(35k)−225° C.

In addition to this criterion, the fusion process requires a glass with a high liquidus viscosity. This is necessary so as to avoid devitrification products at interfaces with glass and to minimize visible devitrification products in the final glass. For a given glass compatible with fusion for a particular sheet size and thickness, adjusting the process so as to manufacture wider sheet or thicker sheet generally results in lower temperatures at either end of the isopipe (the forming mandrel for the fusion process). Thus, disclosed glasses with higher liquidus viscosities provide greater flexibility for manufacturing via the fusion process.

In tests of the relationship between liquidus viscosity and subsequent devitrification tendencies in the fusion process, we were surprised to discover that high delivery temperatures such as those of the disclosed glasses generally require higher liquidus viscosities for long-term production than would be the case for typical AMLCD substrate compositions with lower annealing points. While not wishing to be bound by theory, this requirement appears to arise from accelerated rates of crystal growth as temperature increases. Fusion is essentially an isoviscous process, so a more viscous glass at some fixed temperature must be formed by fusion at higher temperature than a less viscous glass. While some degree of undercooling (cooling below the liquidus temperature) can be sustained for extended periods in a glass at lower temperature, crystal growth rates increase with temperature, and thus more viscous glasses grow an equivalent, unacceptable amount of devitrification products in a shorter period of time than less viscous glasses. Depending on where they form, devitrification products can compromise forming stability, and introduce visible defects into the final glass.

To be formed by the fusion process, it is desirable that the disclosed glass compositions have a liquidus viscosity greater than or equal to 200,000 poises, more preferably greater than or equal to 250,000 poises, higher liquidus viscosities being preferable. A surprising result is that throughout the range of the disclosed glasses, it is possible to obtain a liquidus temperature low enough, and a viscosity high enough, such that the liquidus viscosity of the glass is unusually high compared to compositions outside of the disclosed range.

In the glass compositions described herein, SiO₂ serves as the basic glass former. In certain aspects, the concentration of SiO₂ can be greater than 69 mole percent in order to provide the glass with a density and chemical durability suitable for a flat panel display glass (e.g., an AMLCD glass), and a liquidus temperature (liquidus viscosity), which allows the glass to be formed by a downdraw process (e.g., a fusion process). In terms of an upper limit, in general, the SiO₂ concentration can be less than or equal to about 72.5 mole percent to allow batch materials to be melted using conventional, high volume, melting techniques, e.g., Joule melting in a refractory melter. As the concentration of SiO₂ increases, the 200 poise temperature (melting temperature) generally rises. In various applications, the SiO₂ concentration is adjusted so that the glass composition has a melting temperature less than or equal to 1,725° C. In one aspect, the SiO₂ concentration is between 69 and 72.5 mole percent. In another aspect, the SiO₂ concentration is between 69 and 71.5 mole percent.

Al₂O₃ is another glass former used to make the glasses described herein. An Al₂O₃ concentration greater than or equal to 11 mole percent provides the glass with a low liquidus temperature and high viscosity, resulting in a high liquidus viscosity. The use of at least 12 mole percent Al₂O₃ also improves the glass's annealing point and modulus. In order that the ratio (MgO+CaO+SrO+BaO)/Al₂O₃ is greater than or equal to 1.05, it is desirable to keep the Al₂O₃ concentration below about 13.5 mole percent. In one aspect, the Al₂O₃ concentration is between 11 and 13.5 mole percent. In another aspect, the Al₂O₃ concentration is between 11.5 and 12.5 mole percent.

B₂O₃ is both a glass former and a flux that aids melting and lowers the melting temperature. Its impact on liquidus temperature is at least as great as its impact on viscosity, so increasing B₂O₃ can be used to increase the liquidus viscosity of a glass. To achieve these effects, the glass compositions described herein have B₂O₃ concentrations that are equal to or greater than 1 mole percent. As discussed above with regard to SiO₂, glass durability is very important for LCD applications. Durability can be controlled somewhat by elevated concentrations of alkaline earth oxides, and significantly reduced by elevated B₂O₃ content. Annealing point decreases as B₂O₃ increases, so it is desirable to keep B₂O₃ content low relative to its typical concentration in amorphous silicon substrates. Thus in one aspect, the glasses described herein have B₂O₃ concentrations that are between 1 and 5 mole percent. In another aspect, the glasses have a B₂O₃ content between 2 and 4.5 mol percent. In yet another aspect, the glasses of the present invention have a B₂O₃ content of between 2.5 and 4.5 mol percent.

The Al₂O₃ and B₂O₃ concentrations can be selected as a pair to increase annealing point, increase modulus, improve durability, reduce density, and reduce the coefficient of thermal expansion (CTE), while maintaining the melting and forming properties of the glass.

For example, an increase in B₂O₃ and a corresponding decrease in Al₂O₃ can be helpful in obtaining a lower density and CTE, while an increase in Al₂O₃ and a corresponding decrease in B₂O₃ can be helpful in increasing annealing point, modulus, and durability, provided that the increase in Al₂O₃ does not reduce the (MgO+CaO+SrO+BaO)/Al₂O₃ ratio below about 1.0. For (MgO+CaO+SrO+BaO)/Al₂O₃ ratios below about 1.0, it may be difficult or impossible to remove gaseous inclusions from the glass due to late-stage melting of the silica raw material. Furthermore, when (MgO+CaO+SrO+BaO)/Al₂O₃≦1.05, mullite, an aluminosilicate crystal, can appear as a liquidus phase. Once mullite is present as a liquidus phase, the composition sensitivity of liquidus increases considerably, and mullite devitrification products both grow very quickly and are very difficult to remove once established. Thus in one aspect, the glasses described herein have (MgO+CaO+SrO+BaO)/Al₂O₃≦1.05. Also, and as known in the art, glasses for use in AMLCD applications have CTEs (22-300° C.) in the range of 28-42×10⁻⁷/° C., preferably, 30-40×10⁻⁷/° C., and most preferably, 32-38×10⁻⁷/° C.

In addition to the glass formers (SiO₂, Al₂O₃, and B₂O₃), the glasses described herein also include alkaline earth oxides. In one aspect, at least three alkaline earth oxides are part of the glass composition, e.g., MgO, CaO, and BaO, and, optionally, SrO. The alkaline earth oxides provide the glass with various properties important to melting, fining, forming, and ultimate use. Accordingly, to improve glass performance in these regards, in one aspect, the (MgO+CaO+SrO+BaO)/Al₂O₃ ratio is greater than or equal to 1.05. As this ratio increases, viscosity tends to increase more strongly than liquidus temperature, and thus it is increasingly difficult to obtain suitably high values for T_(35k)−T_(liq). Thus in another aspect, ratio (MgO+CaO+SrO+BaO)/Al₂O₃ is less than or equal to 1.4. In another aspect, the (MgO+CaO+SrO+BaO)/Al₂O₃ ratio is less than or equal to 1.3. In another aspect the ratio is less than 1.2.

For certain embodiments of this invention, the alkaline earth oxides may be treated as what is in effect a single compositional component. This is because their impact upon viscoelastic properties, liquidus temperatures and liquidus phase relationships are qualitatively more similar to one another than they are to the glass forming oxides SiO₂, Al₂O₃ and B₂O₃. However, the alkaline earth oxides CaO, SrO and BaO can form feldspar minerals, notably anorthite (CaAl₂Si₂O₈) and celsian (BaAl₂Si₂O₈) and strontium-bearing solid solutions of same, but MgO does not participate in these crystals to a significant degree. Therefore, when a feldspar crystal is already the liquidus phase, a superaddition of MgO may serves to stabilize the liquid relative to the crystal and thus lower the liquidus temperature. At the same time, the viscosity curve typically becomes steeper, reducing melting temperatures while having little or no impact on low-temperature viscosities. In this sense, the addition of small amounts of MgO benefits melting by reducing melting temperatures, benefits forming by reducing liquidus temperatures and increasing liquidus viscosity, while preserving high annealing point and, thus, low compaction.

A surprising result of the investigation of liquidus trends in glasses with high annealing points is that for glasses with suitably high values of T_(35k)−T_(liq), the ratio of MgO to the other alkaline earths, MgO/(MgO+CaO+SrO+BaO), falls within a relatively narrow range. As noted above, additions of MgO can destabilize feldspar minerals, and thus stabilize the liquid and lower liquidus temperature. However, once MgO reaches a certain level, mullite, Al₆Si₂O₁₃, may be stabilized, thus increasing the liquidus temperature and reducing the liquidus viscosity. Moreover, higher concentrations of MgO tend to decrease the viscosity of the liquid, and thus even if the liquidus viscosity remains unchanged by addition of MgO, it will eventually be the case that the liquidus viscosity will decrease. Thus in another aspect, 0.2≦MgO/(MgO+CaO+SrO+BaO)≦0.35. Within this range, MgO may be varied relative to the glass formers and the other alkaline earth oxides to maximize the value of T_(35k)−T_(liq) consistent with obtaining other desired properties.

Calcium oxide present in the glass composition can produce low liquidus temperatures (high liquidus viscosities), high annealing points and moduli, and CTE's in the most desired ranges for flat panel applications, specifically, AMLCD applications. It also contributes favorably to chemical durability, and compared to other alkaline earth oxides, it is relatively inexpensive as a batch material. However, at high concentrations, CaO increases the density and CTE. Furthermore, at sufficiently low SiO2 concentrations, CaO may stabilize anorthite, thus decreasing liquidus viscosity. Accordingly, in one aspect, the CaO concentration can be greater than or equal to 4 mole percent. In another aspect, the CaO concentration of the glass composition is between about 4 and 6.5 mole percent.

SrO and BaO can both contribute to low liquidus temperatures (high liquidus viscosities) and, thus, the glasses described herein will typically contain at least both of these oxides. However, the selection and concentration of these oxides are selected in order to avoid an increase in CTE and density and a decrease in modulus and annealing point. The relative proportions of SrO and BaO can be balanced so as to obtain a suitable combination of physical properties and liquidus viscosity such that the glass can be formed by a downdraw process.

A surprising result of the investigation of liquidus trends in glasses with high annealing points is glasses with suitably high values of T_(35k)−T_(liq) generally have 0.65≦(CaO+SrO+BaO)/Al₂O₃≦0.95. In the simple RO—Al₂O₃—SiO₂ ternary systems (R=Ca, Sr, Ba), there is a cotectic (and hence a liquidus minimum) between an alkaline earth aluminosilicate (e.g., anorthite or celsian) and mullite. While not wishing to be constrained to theory, it appears that adding MgO to a liquid at or near this cotectic stabilizes the liquid relative to either crystalline phase.

To summarize the effects/roles of the central components of the glasses of the invention, SiO2 is the basic glass former. Al₂O₃ and B₂O₃ are also glass formers and can be selected as a pair with, for example, an increase in B₂O₃ and a corresponding decrease in Al₂O₃ being used to obtain a lower density and CTE, while an increase in Al₂O₃ and a corresponding decrease in B₂O₃ being used in increasing annealing point, modulus, and durability, provided that the increase in Al₂O₃ does not reduce the RO/Al₂O₃ ratio below about 1.05, where RO=(MgO+CaO+SrO+BaO). If the ratio goes too low, meltability is compromised, i.e., the melting temperature becomes too high. B₂O₃ can be used to bring the melting temperature down, but high levels of B₂O₃ compromise annealing point.

In addition to meltability and annealing point considerations, for AMLCD applications, the CTE of the glass should be compatible with that of silicon. To achieve such CTE values, the glasses of the invention control the RO content of the glass. For a given Al₂O₃ content, controlling the RO content corresponds to controlling the RO/Al₂O₃ ratio. In practice, glasses having suitable CTE's are produced if the RO/Al₂O₃ ratio is below about 1.2.

On top of these considerations, the glasses are preferably formable by a downdraw process, e.g., a fusion process, which means that the glass' liquidus viscosity needs to be relatively high. Individual alkaline earths play an important role in this regard since they can destabilize the crystalline phases that would otherwise form. BaO and SrO are particularly effective in controlling the liquidus viscosity and are included in the glasses of the invention for at least this purpose. As illustrated in the examples presented below, various combinations of the alkaline earths will produce glasses having high liquidus viscosities, with the total of the alkaline earths satisfying the RO/Al₂O₃ ratio constraints needed to achieve low melting temperatures, high annealing points, and suitable CTE's.

In addition to the above components, the glass compositions described herein can include various other oxides to adjust various physical, melting, fining, and forming attributes of the glasses. Examples of such other oxides include, but are not limited to, TiO₂, MnO, Fe₂O₃, ZnO, Nb₂O₅, MoO₃, Ta₂O₅, WO₃, Y₂O₃, La₂O₃ and CeO₂. In one aspect, the amount of each of these oxides can be less than or equal to 2.0 mole percent, and their total combined concentration can be less than or equal to 4.0 mole percent. The glass compositions described herein can also include various contaminants associated with batch materials and/or introduced into the glass by the melting, fining, and/or forming equipment used to produce the glass, particularly Fe₂O₂ and ZrO₂. The glasses can also contain SnO₂ either as a result of Joule melting using tin-oxide electrodes and/or through the batching of tin containing materials, e.g., SnO₂, SnO, SnCO₃, SnC₂O₂, etc.

The glass compositions are generally alkali free; however, the glasses can contain some alkali contaminants. In the case of AMLCD applications, it is desirable to keep the alkali levels below 0.1 mole percent to avoid having a negative impact on thin film transistor (TFT) performance through diffusion of alkali ions from the glass into the silicon of the TFT. As used herein, an “alkali-free glass” is a glass having a total alkali concentration which is less than or equal to 0.1 mole percent, where the total alkali concentration is the sum of the Na₂O, K₂O, and Li₂O concentrations. In one aspect, the total alkali concentration is less than or equal to 0.1 mole percent.

As discussed above, (MgO+CaO+SrO+BaO)/Al₂O₃ ratios greater than or equal to 1.05 improve fining, i.e., the removal of gaseous inclusions from the melted batch materials. This improvement allows for the use of more environmentally friendly fining packages. For example, on an oxide basis, the glass compositions described herein can have one or more or all of the following compositional characteristics: (i) an As₂O₃ concentration of at most 0.05 mole percent; (ii) an Sb₂O₃ concentration of at most 0.05 mole percent; (iii) a SnO₂ concentration of at most 0.25 mole percent.

As₂O₃ is an effective high temperature fining agent for AMLCD glasses, and in some aspects described herein, As₂O₃ is used for fining because of its superior fining properties. However, As₂O₃ is poisonous and requires special handling during the glass manufacturing process. Accordingly, in certain aspects, fining is performed without the use of substantial amounts of As₂O₃, i.e., the finished glass has at most 0.05 mole percent As₂O₃. In one aspect, no As₂O₃ is purposely used in the fining of the glass. In such cases, the finished glass will typically have at most 0.005 mole percent As₂O₃ as a result of contaminants present in the batch materials and/or the equipment used to melt the batch materials.

Although not as toxic as As₂O₃, Sb₂O₃ is also poisonous and requires special handling. In addition, Sb₂O₃ raises the density, raises the CTE, and lowers the annealing point in comparison to glasses that use As₂O₃ or SnO₂ as a fining agent. Accordingly, in certain aspects, fining is performed without the use of substantial amounts of Sb₂O₃, i.e., the finished glass has at most 0.05 mole percent Sb₂O₃. In another aspect, no Sb₂O₃ is purposely used in the fining of the glass. In such cases, the finished glass will typically have at most 0.005 mole percent Sb₂O₃ as a result of contaminants present in the batch materials and/or the equipment used to melt the batch materials.

Compared to As₂O₃ and Sb₂O₃ fining, tin fining (i.e., SnO₂ fining) is less effective, but SnO₂ is a ubiquitous material that has no known hazardous properties. Also, for many years, SnO₂ has been a component of AMLCD glasses through the use of tin oxide electrodes in the Joule melting of the batch materials for such glasses. The presence of SnO₂ in AMLCD glasses has not resulted in any known adverse effects in the use of these glasses in the manufacture of liquid crystal displays. However, high concentrations of SnO₂ are not preferred as this can result in the formation of crystalline defects in AMLCD glasses. In one aspect, the concentration of SnO₂ in the finished glass is less than or equal to 0.25 mole percent.

Tin fining can be used alone or in combination with other fining techniques if desired. For example, tin fining can be combined with halide fining, e.g., bromine fining. Other possible combinations include, but are not limited to, tin fining plus sulfate, sulfide, cerium oxide, mechanical bubbling, and/or vacuum fining. It is contemplated that these other fining techniques can be used alone. In certain aspects, maintaining the (MgO+CaO+SrO+BaO)/Al₂O₃ ratio and individual alkaline earth concentrations within the ranges discussed above makes the fining process easier to perform and more effective.

The glasses described herein can be manufactured using various techniques known in the art. In one aspect, the glasses are made using a downdraw process such as, for example, a fusion downdraw process. In one aspect, described herein is a method for producing an alkali-free glass sheet by a downdraw process comprising selecting, melting, and fining batch materials so that the glass making up the sheets comprises SiO₂, Al₂O₃, B₂O₃, MgO, CaO and BaO, and, on an oxide basis, comprises: (i) a (MgO+CaO+SrO+BaO)/Al₂O₃ ratio greater than or equal to 1.05; (ii) a MgO content greater than or equal to 3.0 mole percent; (iii) a CaO content greater than or equal to 4.0 mole percent; and (iv) a BaO content greater than or equal to 1.05 mole percent, wherein: (a) the fining is performed without the use of substantial amounts of arsenic (and, optionally, without the use of substantial amounts of antimony); and (b) a population of 50 sequential glass sheets produced by the downdraw process from the melted and fined batch materials has an average gaseous inclusion level of less than 0.10 gaseous inclusions/cubic centimeter, where each sheet in the population has a volume of at least 500 cubic centimeters.

EXAMPLES

The following examples are set forth below to illustrate the methods and results according to the disclosed subject matter. These examples are not intended to be inclusive of all aspects of the subject matter disclosed herein, but rather to illustrate representative methods and results. These examples are not intended to exclude equivalents and variations of the present invention which are apparent to one skilled in the art.

Efforts have been made to ensure accuracy with respect to numbers (e.g., amounts, temperature, etc.) but some errors and deviations should be accounted for. Unless indicated otherwise, temperature is in ° C. or is at ambient temperature, and pressure is at or near atmospheric. The compositions themselves are given in mole percent on an oxide basis and have been normalized to 100%. There are numerous variations and combinations of reaction conditions, e.g., component concentrations, temperatures, pressures and other reaction ranges and conditions that can be used to optimize the product purity and yield obtained from the described process. Only reasonable and routine experimentation will be required to optimize such process conditions.

The glass properties set forth in Table 1 were determined in accordance with techniques conventional in the glass art. Thus, the linear coefficient of thermal expansion (CTE) over the temperature range 25-300° C. is expressed in terms of ×10⁻⁷/° C. and the annealing point is expressed in terms of ° C. These were determined from fiber elongation techniques (ASTM references E228-85 and C336, respectively). The density in terms of grams/cm³ was measured via the Archimedes method (ASTM C693). The melting temperature in terms of ° C. (defined as the temperature at which the glass melt demonstrates a viscosity of 200 poises) was calculated employing a Fulcher equation fit to high temperature viscosity data measured via rotating cylinders viscometry (ASTM C965-81).

The liquidus temperature of the glass in terms of ° C. was measured using the standard gradient boat liquidus method of ASTM C829-81. This involves placing crushed glass particles in a platinum boat, placing the boat in a furnace having a region of gradient temperatures, heating the boat in an appropriate temperature region for 24 hours, and determining by means of microscopic examination the highest temperature at which crystals appear in the interior of the glass. More particularly, the glass sample is removed from the Pt boat in one piece, and examined using polarized light microscopy to identify the location and nature of crystals which have formed against the Pt and air interfaces, and in the interior of the sample. Because the gradient of the furnace is very well known, temperature vs. location can be well estimated, within 5-10° C. The temperature at which crystals are observed in the internal portion of the sample is taken to represent the liquidus of the glass (for the corresponding test period). Testing is sometimes carried out at longer times (e.g. 72 hours), in order to observe slower growing phases. The temperature corresponding to 200 poise and the viscosity at the liquidus (in poises) were determined from fits to high viscosity data using the Vogel-Fulcher-Tammann equation, log(η)=A+B/(T−T _(o)) in which T is temperature and A, B and T_(o) are fitting parameters. To determine liquidus viscosity, the liquidus temperature is used as the value for T. Young's modulus values in terms of GPa were determined using a resonant ultrasonic spectroscopy technique of the general type set forth in ASTM E1875-00e1.

As can be seen in Table 1, the exemplary glasses have density, CTE, annealing point and Young's modulus values that make the glasses suitable for display applications, such as AMLCD substrate applications, and more particularly for low-temperature polysilicon and oxide thin film transistor applications. Although not shown in Table 1, the glasses have durabilities in acid and base media that are similar to those obtained from commercial AMLCD substrates, and thus are appropriate for AMLCD applications. The exemplary glasses can be formed using downdraw techniques, and in particular are compatible with the fusion process, via the aforementioned criteria.

The exemplary glasses of Table 1 were prepared using a commercial sand as a silica source, milled such that 90% by weight passed through a standard U.S. 100 mesh sieve. Alumina was the alumina source, periclase was the source for MgO, limestone the source for CaO, strontium carbonate, strontium nitrate or a mix thereof was the source for SrO, barium carbonate was the source for BaO, and tin (IV) oxide was the source for SnO₂. The raw materials were thoroughly mixed, loaded into a platinum vessel suspended in a furnace heated by silicon carbide glowbars, melted and stirred for several hours at temperatures between 1600 and 1650° C. to ensure homogeneity, and delivered through an orifice at the base of the platinum vessel. The resulting patties of glass were annealed at or near the annealing point, and then subjected to various experimental methods to determine physical, viscous and liquidus attributes.

These methods are not unique, and the glasses of Table 1 can be prepared using standard methods well-known to those skilled in the art. Such methods include a continuous melting process, such as would be performed in a continuous melting process, wherein the metier used in the continuous melting process is heated by gas, by electric power, or combinations thereof.

Raw materials appropriate for producing the disclosed glass include commercially available sands as sources for SiO₂; alumina, aluminum hydroxide, hydrated forms of alumina, and various aluminosilicates, nitrates and halides as sources for Al₂O₃; boric acid, anhydrous boric acid and boric oxide as sources for B₂O₃; periclase, dolomite (also a source of CaO), magnesia, magnesium carbonate, magnesium hydroxide, and various forms of magnesium silicates, aluminosilicates, nitrates and halides as sources for MgO; limestone, aragonite, dolomite (also a source of MgO), wolastonite, and various forms of calcium silicates, aluminosilicates, nitrates and halides as sources for CaO; and oxides, carbonates, nitrates and halides of strontium and barium. If a chemical fining agent is desired, tin can be added as SnO₂, as a mixed oxide with another major glass component (e.g., CaSnO₃), or in oxidizing conditions as SnO, tin oxalate, tin halide, or other compounds of tin known to those skilled in the art.

The glasses in Table 1 contain SnO₂ as a fining agent, but other chemical fining agents could also be employed to obtain glass of sufficient quality for TFT substrate applications. For example, the disclosed glasses could employ any one or combinations of As₂O₃, Sb₂O₃, CeO₂, Fe₂O₃, and halides as deliberate additions to facilitate fining, and any of these could be used in conjunction with the SnO₂ chemical fining agent shown in the examples. Of these, As₂O₃ and Sb₂O₃ are generally recognized as hazardous materials, subject to control in waste streams such as might be generated in the course of glass manufacture or in the processing of TFT panels. It is therefore desirable to limit the concentration of As₂O₃ and Sb₂O₃ individually or in combination to no more than 0.005 mol %.

In addition to the elements deliberately incorporated into the disclosed glasses, nearly all stable elements in the periodic table are present in glasses at some level, either through low levels of contamination in the raw materials, through high-temperature erosion of refractories and precious metals in the manufacturing process, or through deliberate introduction at low levels to fine tune the attributes of the final glass. For example, zirconium may be introduced as a contaminant via interaction with zirconium-rich refractories. As a further example, platinum and rhodium may be introduced via interactions with precious metals. As a further example, iron may be introduced as a tramp in raw materials, or deliberately added to enhance control of gaseous inclusions. As a further example, manganese may be introduced to control color or to enhance control of gaseous inclusions. As a further example, alkalis may be present as a tramp component at levels up to about 0.1 mol % for the combined concentration of Li₂O, Na₂O and K₂O.

Hydrogen is inevitably present in the form of the hydroxyl anion, OH⁻, and its presence can be ascertained via standard infrared spectroscopy techniques. Dissolved hydroxyl ions significantly and nonlinearly impact the annealing point of the disclosed glasses, and thus to obtain the desired annealing point it may be necessary to adjust the concentrations of major oxide components so as to compensate. Hydroxyl ion concentration can be controlled to some extent through choice of raw materials or choice of melting system. For example, boric acid is a major source of hydroxyls, and replacing boric acid with boric oxide can be a useful means to control hydroxyl concentration in the final glass. The same reasoning applies to other potential raw materials comprising hydroxyl ions, hydrates, or compounds comprising physisorbed or chemisorbed water molecules. If burners are used in the melting process, then hydroxyl ions can also be introduced through the combustion products from combustion of natural gas and related hydrocarbons, and thus it may be desirable to shift the energy used in melting from burners to electrodes to compensate. Alternatively, one might instead employ an iterative process of adjusting major oxide components so as to compensate for the deleterious impact of dissolved hydroxyl ions.

Sulfur is often present in natural gas, and likewise is a tramp component in many carbonate, nitrate, halide, and oxide raw materials. In the form of SO₂, sulfur can be a troublesome source of gaseous inclusions. The tendency to form SO₂-rich defects can be managed to a significant degree by controlling sulfur levels in the raw materials, and by incorporating low levels of comparatively reduced multivalent cations into the glass matrix. While not wishing to be bound by theory, it appears that SO₂-rich gaseous inclusions arise primarily through reduction of sulfate (SO₄ ^(═)) dissolved in the glass. The elevated barium concentrations of the disclosed glasses appear to increase sulfur retention in the glass in early stages of melting, but as noted above, barium is required to obtain low liquidus temperature, and hence high T_(35k)−T_(liq) and high liquidus viscosity. Deliberately controlling sulfur levels in raw materials to a low level is a useful means of reducing dissolved sulfur (presumably as sulfate) in the glass. In particular, sulfur is preferably less than 200 ppm by weight in the batch materials, and more preferably less than 100 ppm by weight in the batch materials.

Reduced multivalents can also be used to control the tendency of the disclosed glasses to form SO₂ blisters. While not wishing to be bound to theory, these elements behave as potential electron donors that suppress the electromotive force for sulfate reduction. Sulfate reduction can be written in terms of a half reaction such as SO₄ ^(═)→SO₂+O₂+2e− where e− denotes an electron. The “equilibrium constant” for the half reaction is K_(eq)=[SO₂][O₂ ][e−] ²/[SO₄ ⁼] where the brackets denote chemical activities. Ideally one would like to force the reaction so as to create sulfate from SO₂, O₂ and 2e−. Adding nitrates, peroxides, or other oxygen-rich raw materials may help, but also may work against sulfate reduction in the early stages of melting, which may counteract the benefits of adding them in the first place. SO₂ has very low solubility in most glasses, and so is impractical to add to the glass melting process. Electrons may be “added” through reduced multivalents. For example, an appropriate electron-donating half reaction for ferrous iron (Fe^(2′)) is expressed as 2Fe²⁺→2Fe³⁺+2e−

This “activity” of electrons can force the sulfate reduction reaction to the left, stabilizing SO₄ ^(═) in the glass. Suitable reduced multivalents include, but are not limited to, Fe²⁺, Mn²⁺, Sn²⁺, Sb³⁺, As³⁺, V³⁺, Ti³⁺, and others familiar to those skilled in the art. In each case, it may be important to minimize the concentrations of such components so as to avoid deleterious impact on color of the glass, or in the case of As and Sb, to avoid adding such components at a high enough level so as to complication of waste management in an end-user's process.

In addition to the major oxides components of the disclosed glasses, and the minor or tramp constituents noted above, halides may be present at various levels, either as contaminants introduced through the choice of raw materials, or as deliberate components used to eliminate gaseous inclusions in the glass. As a fining agent, halides may be incorporated at a level of about 0.4 mol % or less, though it is generally desirable to use lower amounts if possible to avoid corrosion of off-gas handling equipment. In a preferred embodiment, the concentration of individual halide elements are below about 200 ppm by weight for each individual halide, or below about 800 ppm by weight for the sum of all halide elements.

In addition to these major oxide components, minor and tramp components, multivalents and halide fining agents, it may be useful to incorporate low concentrations of other colorless oxide components to achieve desired physical, optical or viscoelastic properties. Such oxides include, but are not limited to, TiO₂, ZrO₂, HfO₂, Nb₂O₅, Ta₂O₅, MoO₃, WO₃, ZnO, In₂O₃, Ga₂O₃, Bi₂O₃, GeO₂, PbO, SeO₃, TeO₂, Y₂O₃, La₂O₃, Gd₂O₃, and others known to those skilled in the art. Through an iterative process of adjusting the relative proportions of the major oxide components of the disclosed glasses, such colorless oxides can be added to a level of up to about 2 mol % without unacceptable impact to annealing point, T_(35k)−T_(liq) or liquidus viscosity.

TABLE 1 Example 1 2 3 4 5 6 7 8 SiO₂ 69.44 70.45 70.76 70.92 70.31 70.31 71.38 70.74 Al₂O₃ 12.36 13.17 12.25 12.31 12.42 13.21 12.24 13 B₂O₃ 4.35 2.47 3 2.21 2.36 2.53 1.75 2.48 MgO 4.01 3.53 3.69 3.93 4.33 3.46 4.18 3.35 CaO 5.98 4.83 5.69 5.2 5.27 4.8 5.33 4.58 SrO 1.73 1.24 2.58 1.24 1.28 1.27 1.26 1.43 BaO 1.98 4.17 1.91 4.04 3.88 4.15 3.72 4.28 SnO₂ 0.1 0.1 0.09 0.11 0.11 0.11 0.11 0.1 Fe₂O₃ 0.02 0.01 0.02 0.01 0.01 0.14 0.01 0.01 ZrO₂ 0.03 0.02 0.02 0.02 0.02 0.02 0.01 0.02 (MgO + CaO + SrO + BaO)/Al₂O₃ 1.11 1.05 1.13 1.17 1.19 1.04 1.18 1.05 MgO/(MgO + CaO + SrO + BaO) 0.293 0.256 0.266 0.273 0.293 0.253 0.288 0.246 (CaO + SrO + BaO)/Al₂O₃ 0.707 0.744 0.734 0.727 0.707 0.747 0.712 0.754 CaO/(CaO + SrO) 0.776 0.796 0.688 0.807 0.805 0.791 0.809 0.762 CTE (×10⁻⁷/° C.) 35.3 35.3 34.2 37.4 37 36.2 36.7 36.4 density (g/cm³) 2.53 2.602 2.551 2.602 2.596 2.607 2.595 2.605 strain point (° C.) 720 741.4 733.3 740.7 741 737.8 741 743.1 annealing point (° C.) 771 795.6 785.5 792.5 789.8 788.8 794.4 795.9 Young's modulus (GPa) 80.3 81.3 81.1 80.7 81.1 81.5 82.2 80.7 T at 200 poise (° C.) 1642 1681 1677 1684 1670 1665 1685 1681 T at 35000 poise (° C.) 1266 1304 1304 1302 1294 1305 1298 1307 liquidus temperature (° C.) 1170 1195 1180 1190 1180 1190 1190 1190 liquidus viscosity (poise) 2.8E+05 3.7E+05 5.4E+05 3.8E+05 4.2E+05 4.3E+05 3.5E+05 4.3E+05 T_(35k) − T_(liq) 96 109 124 112 114 115 108 117 0.25T_(35k) − 225 91.5 101 101 100.5 98.5 101.25 99.5 101.75 Example 9 10 11 12 13 14 15 16 SiO₂ 71.39 70.7 71.01 70.84 70.52 71.02 71.8 71.49 Al₂O₃ 12.65 12.69 12.36 12.19 12.97 12.62 12.42 12.3 B₂O₃ 2.62 2.12 1.85 2.2 2.32 2 1.64 1.67 MgO 3.77 3.88 4.13 4.34 3.65 4.24 4.01 4.03 CaO 4.84 5.13 5.32 5.26 4.95 5.11 5.16 5.3 SrO 1.17 1.29 1.3 1.26 1.27 1.17 1.22 1.26 BaO 3.41 3.99 3.87 3.78 4.07 3.69 3.6 3.81 SnO₂ 0.12 0.11 0.12 0.11 0.11 0.11 0.11 0.11 Fe₂O₃ 0.01 0.08 0.03 0.01 0.11 0.01 0.01 0.02 ZrO₂ 0.02 0.02 0.02 0.02 0.02 0.02 0.01 0.01 (MgO + CaO + SrO + BaO)/Al₂O₃ 1.04 1.13 1.18 1.2 1.08 1.13 1.13 1.17 MgO/(MgO + CaO + SrO + BaO) 0.286 0.272 0.282 0.296 0.262 0.298 0.287 0.28 (CaO + SrO + BaO)/Al₂O₃ 0.714 0.728 0.718 0.704 0.738 0.702 0.713 0.72 CaO/(CaO + SrO) 0.805 0.799 0.804 0.807 0.796 0.814 0.809 0.808 CTE (×10⁻⁷/° C.) 35.5 37 37.3 36.7 36.3 35.3 36.4 36.5 density (g/cm³) 2.57 2.604 2.602 2.594 2.605 2.59 2.591 2.597 strain point (° C.) 742 741.5 741.6 737.8 742 743.8 745.1 745.3 annealing point (° C.) 795.8 793 794.4 790.2 793.9 797.3 798.4 798.3 Young's modulus (GPa) 81.5 82.2 82 81.7 82.1 82.4 81.9 T at 200 poise (° C.) 1690 1674 1677 1679 1678 1685 1695 1689 T at 35000 poise (° C.) 1307 1305 1304 1295 1304 1305 1304 1303 liquidus temperature (° C.) 1190 1180 1180 1175 1180 1180 1190 1185 liquidus viscosity (poise) 4.3E+05 5.3E+05 5.4E+05 4.7E+05 5.2E+05 5.4E+05 4.0E+05 4.5E+05 T_(35k) − T_(liq) 117 125 124 120 124 125 114 118 0.25T_(35k) − 225 101.75 101.25 101 98.75 101 101.25 101 100.75 Example 17 18 19 20 21 22 23 24 SiO₂ 71.02 71.29 71.51 71.24 71.85 70.88 70.72 71.54 Al₂O₃ 12.47 12.52 12.39 12.39 12.63 12.64 12.9 12.52 B₂O₃ 1.93 2.42 1.96 2.12 1.69 2.05 2.24 2.29 MgO 3.98 3.91 3.88 4.06 3.91 3.9 3.69 3.64 CaO 5.18 5 5.2 5.17 5.05 5.12 4.98 5.07 SrO 1.29 1.2 1.21 1.24 1.2 1.27 1.24 1.19 BaO 3.97 3.51 3.72 3.63 3.53 4 4.09 3.64 SnO₂ 0.12 0.12 0.1 0.12 0.11 0.1 0.1 0.1 Fe₂O₃ 0.01 0.01 0.01 0.01 0.01 0.01 0.01 0.01 ZrO₂ 0.02 0.02 0.01 0.02 0.01 0.02 0.02 0.01 (MgO + CaO + SrO + BaO)/Al₂O₃ 1.16 1.09 1.13 1.14 1.08 1.13 1.09 1.08 MgO/(MgO + CaO + SrO + BaO) 0.276 0.287 0.277 0.288 0.286 0.273 0.264 0.269 (CaO + SrO + BaO)/Al₂O₃ 0.724 0.713 0.723 0.712 0.714 0.727 0.736 0.731 CaO/(CaO + SrO) 0.801 0.806 0.811 0.807 0.808 0.801 0.801 0.81 CTE (×10⁻⁷/° C.) 37.3 35.2 35.3 35.2 35.5 36.1 35.6 35.2 density (g/cm³) 2.603 2.578 2.585 2.587 2.584 2.602 2.601 2.578 strain point (° C.) 744.8 739.5 742.5 742.4 752.1 743.4 743.6 744.7 annealing point (° C.) 796.9 793.3 795.5 795 806 795.7 797.3 797.5 Young's modulus (GPa) 81.6 81.3 81.3 81.3 82.6 80.3 81.3 T at 200 poise (° C.) 1686 1683 1689 1681 1685 1685 1682 1698 T at 35000 poise (° C.) 1306 1308 1308 1305 1298 1303 1305 1311 liquidus temperature (° C.) 1180 1180 1180 1175 1185 1170 1170 1175 liquidus viscosity (poise) 5.4E+05 5.8E+05 5.5E+05 6.1E+05 3.9E+05 6.5E+05 6.9E+05 6.7E+05 T_(35k) − T_(liq) 126 128 128 130 113 133 135 136 0.25T_(35k) − 225 101.5 102 102 101.25 99.5 100.75 101.25 102.75 Example 25 26 27 28 29 30 31 32 SiO₂ 71.17 70.8 70.85 70.75 71.33 71.34 71.27 71.32 Al₂O₃ 12.55 11.8 11.92 11.91 11.65 11.63 11.65 11.59 B₂O₃ 1.92 4.4 4.34 4.18 1.78 1.78 1.8 1.88 MgO 3.94 3.27 3.35 3.44 4.3 4.19 4.29 4.09 CaO 5.17 6.06 5.85 5.92 5.39 5.53 5.46 5.7 SrO 1.24 0.96 0.97 1.06 1.38 1.28 1.21 1.07 BaO 3.89 2.59 2.6 2.63 4.03 4.12 4.18 4.21 SnO₂ 0.1 0.09 0.1 0.09 0.1 0.1 0.1 0.1 Fe₂O₃ 0.01 0.01 0.01 0.01 0.01 0.01 0.01 0.01 ZrO₂ 0.02 0.01 0.01 0.01 0.02 0.02 0.02 0.02 (MgO + CaO + SrO + BaO)/Al₂O₃ 1.14 1.09 1.07 1.10 1.30 1.30 1.30 1.30 MgO/(MgO + CaO + SrO + BaO) 0.277 0.25 0.26 0.26 0.28 0.28 0.28 0.27 (CaO + SrO + BaO)/Al₂O₃ 0.723 0.75 0.74 0.74 0.93 0.94 0.93 0.95 CaO/(CaO + SrO) 0.807 0.86 0.86 0.85 1 1 1 1 CTE (×10⁻⁷/° C.) 36.6 34.1 33.5 33.8 36.5 37.2 37 37.2 density (g/cm³) 2.594 2.521 2.522 2.528 2.606 2.606 2.607 2.607 strain point (° C.) 743.3 774 776 775 737.4 736.7 736.7 736.8 annealing point (° C.) 795.4 1022.1 1024 1023 789.5 788.5 789.1 789.1 Young's modulus (GPa) 81.9 81.7 81.2 81.4 81.3 T at 200 poise (° C.) 1687 1687 1689 1686 1699 1699 1698 1699 T at 35000 poise (° C.) 1306 1304 1306 1304 1299 1299 1298 1299 liquidus temperature (° C.) 1165 1185 1175 1175 1180 1180 1180 liquidus viscosity (poise) 7.9E+05 2.9E+05 3.8E+05 5.1E+05 4.8E+05 4.7E+05 4.4E+05 T_(35k) − T_(liq) 141 102 114 124 119 118 119 0.25T_(35k) − 225 101.5 96.75 97.25 99.75 99.75 99.5 99.75 Example 33 34 35 36 37 38 39 40 SiO₂ 71.27 71.51 70.43 70.44 70.27 70.46 70.59 70.15 Al₂O₃ 11.52 11.58 12.06 12.21 12.19 12.03 12.1 12.3 B₂O₃ 1.95 1.62 4.35 4.09 4.26 4.29 4.06 4.05 MgO 4.29 4.23 3.47 3.67 3.56 3.44 3.66 3.64 CaO 5.5 5.65 5.74 5.14 5.73 5.92 5.56 5.78 SrO 0.89 1.08 1.39 1.21 1.35 1.3 1.26 1.34 BaO 4.43 4.2 2.44 3.13 2.54 2.44 2.66 2.65 SnO₂ 0.1 0.1 0.09 0.09 0.08 0.1 0.09 0.08 Fe₂O₃ 0.01 0.01 0.01 0.01 0.01 0.01 0.01 0.01 ZrO₂ 0.02 0.02 0.01 0.01 0.01 0.01 0.01 0.01 (MgO + CaO + SrO + BaO)/Al₂O₃ 1.31 1.31 1.08 1.08 1.09 1.09 1.09 1.08 MgO/(MgO + CaO + SrO + BaO) 0.28 0.28 0.28 0.27 0.26 0.28 0.27 0.28 (CaO + SrO + BaO)/Al₂O₃ 0.94 0.94 0.78 0.79 0.8 0.78 0.79 0.78 CaO/(CaO + SrO) 1 1 0.81 0.81 0.82 0.82 0.81 0.81 CTE (×10⁻⁷/° C.) 36.7 37 34 34.3 34.1 34.4 33.9 34.4 density (g/cm³) 2.611 2.61 2.527 2.548 2.532 2.528 2.533 2.54 strain point (° C.) 735.6 742.8 722.1 722.4 721.6 720.7 723.5 723.9 annealing point (° C.) 787.5 794.6 774 775.7 774.8 772.8 775.4 776.6 Young's modulus (GPa) 81.3 81.6 80 79.6 79.2 79.5 79.2 80.2 T at 200 poise (° C.) 1699 1702 1679 1685 1675 1678 1682 1673 T at 35000 poise (° C.) 1298 1301 1283 1287 1281 1283 1286 1281 liquidus temperature (° C.) 1190 1175 1160 1150 1170 1165 1165 1160 liquidus viscosity (poise) 3.4E+05 5.5E+05 4.9E+05 6.9E+05 3.8E+05 4.3E+05 4.7E+05 4.8E+05 T_(35k) − T_(liq) 108 126 123 137 111 118 121 121 0.25T_(35k) − 225 99.5 100.25 95.75 96.75 95.25 95.75 96.5 95.25 Example 41 42 43 44 45 46 47 48 SiO₂ 70.53 70.44 70.42 70.5 69.9 70.21 70.59 70.22 Al₂O₃ 12.12 11.96 12.05 11.91 12.22 12.04 11.87 12.06 B₂O₃ 3.94 4.27 4.07 3.96 3.71 3.79 3.79 3.6 MgO 3.29 3.42 3.62 3.69 3.77 3.68 3.63 3.86 CaO 5.15 6 5.63 5.64 6.15 6.1 6.01 5.37 SrO 1.2 1.23 1.29 1.29 1.35 1.33 1.31 1.23 BaO 3.66 2.58 2.81 2.91 2.78 2.73 2.69 3.54 SnO₂ 0.09 0.08 0.08 0.09 0.09 0.09 0.09 0.09 Fe₂O₃ 0.01 0.01 0.01 0.01 0.01 0.01 0.01 0.01 ZrO₂ 0.01 0.01 0.01 0.01 0.02 0.02 0.02 0.02 (MgO + CaO + SrO + BaO)/Al₂O₃ 1.1 1.11 1.11 1.14 1.15 1.15 1.15 1.16 MgO/(MgO + CaO + SrO + BaO) 0.25 0.26 0.27 0.27 0.27 0.27 0.27 0.28 (CaO + SrO + BaO)/Al₂O₃ 0.83 0.82 0.81 0.83 0.84 0.84 0.84 0.84 CaO/(CaO + SrO) 0.81 0.83 0.81 0.81 0.82 0.82 0.82 0.81 CTE (×10⁻⁷/° C.) 35.4 34.2 34.8 34.8 35.6 35.9 density (g/cm³) 2.563 2.532 2.543 2.548 2.555 2.539 2.531 2.571 strain point (° C.) 723.2 720.5 720.1 720.9 723.5 annealing point (° C.) 775.6 772.5 772.5 773.1 775.9 Young's modulus (GPa) 79.1 79.4 79.5 79.4 79.8 T at 200 poise (° C.) 1691 1678 1680 1680 1666 1672 1679 1679 T at 35000 poise (° C.) 1290 1282 1284 1284 1277 1280 1284 1284 liquidus temperature (° C.) 1150 1170 1150 1160 1170 1170 1180 1150 liquidus viscosity (poise) 7.3E+05 3.8E+05 6.5E+05 5.0E+05 3.5E+05 3.7E+05 3.1E+05 6.5E+05 T_(35k) − T_(liq) 140 112 134 124 107 110 104 134 0.25T_(35k) − 225 97.5 95.5 96 96 94.25 95 96 96 Example 49 50 51 52 53 54 55 56 SiO₂ 70.51 70.05 69.84 69.99 70.37 70.24 70.03 70.5 Al₂O₃ 12.02 12.14 12.17 12.21 11.99 12.04 12.01 11.89 B₂O₃ 3.22 3.49 3.67 3.31 3.32 3.46 3.65 3.32 MgO 3.72 3.86 3.88 4.06 3.85 4.03 3.98 3.64 CaO 5.25 5.5 6.06 5.49 5.29 5.48 5.49 5.33 SrO 1.21 1.75 1.42 1.23 1.22 1.32 1.59 1.2 BaO 3.93 3.08 2.84 3.61 3.83 3.32 3.13 3.99 SnO₂ 0.09 0.09 0.09 0.08 0.09 0.09 0.09 0.09 Fe₂O₃ 0.01 0.01 0.01 0.01 0.01 0.01 0.01 0.01 ZrO₂ 0.02 0.02 0.02 0.01 0.02 0.02 0.02 0.02 (MgO + CaO + SrO + BaO)/Al₂O₃ 1.17 1.17 1.17 1.18 1.18 1.18 1.18 1.19 MgO/(MgO + CaO + SrO + BaO) 0.26 0.27 0.27 0.28 0.27 0.28 0.28 0.26 (CaO + SrO + BaO)/Al₂O₃ 0.86 0.85 0.85 0.85 0.86 0.84 0.85 0.88 CaO/(CaO + SrO) 0.81 0.76 0.81 0.82 0.81 0.81 0.78 0.82 CTE (×10⁻⁷/° C.) 35.5 35.6 35.4 35.5 36.2 35.7 density (g/cm³) 2.586 2.569 2.559 2.58 2.583 2.568 2.588 2.588 strain point (° C.) 727.5 721.3 727.6 724.1 723.5 721.2 727.1 annealing point (° C.) 781.3 774.2 778.6 777.5 775.1 773.8 779.1 Young's modulus (GPa) 80 80.3 81.3 79.5 80.5 80.2 79.3 T at 200 poise (° C.) 1689 1673 1664 1673 1684 1676 1671 1688 T at 35000 poise (° C.) 1290 1281 1276 1281 1287 1283 1279 1289 liquidus temperature (° C.) 1150 1165 1170 1160 1150 1160 1165 1150 liquidus viscosity (poise) 7.5E+05 4.3E+05 3.4E+05 4.9E+05 7.0E+05 5.0E+05 4.1E+05 7.2E+05 T_(35k) − T_(liq) 140 116 106 121 137 123 114 139 0.25T_(35k) − 225 97.5 95.25 94 95.25 96.75 95.75 94.75 97.25 Example 57 58 59 60 61 62 63 64 SiO₂ 70.51 70.39 70.22 69.77 70.04 69.66 70.71 70.63 Al₂O₃ 11.68 11.77 11.84 12.21 12.01 12.04 11.49 11.5 B₂O₃ 3.67 3.5 3.49 3.12 3.25 3.49 3.49 3.66 MgO 3.73 3.99 3.91 4.66 4.23 4.26 3.8 3.76 CaO 5.81 5.57 5.81 5.71 5.74 5.66 5.97 6.04 SrO 1.39 1.26 1.35 1.22 2.15 1.68 1.46 1.35 BaO 3.11 3.42 3.28 3.19 2.46 3.07 2.91 2.96 SnO₂ 0.08 0.08 0.08 0.09 0.08 0.1 0.08 0.08 Fe₂O₃ 0.01 0.01 0.01 0.01 0.01 0.01 0.08 0.01 ZrO₂ 0.02 0.01 0.02 0.02 0.02 0.02 0.02 0.02 (MgO + CaO + SrO + BaO)/Al₂O₃ 1.2 1.21 1.21 1.21 1.21 1.22 1.23 1.23 MgO/(MgO + CaO + SrO + BaO) 0.27 0.28 0.27 0.32 0.29 0.29 0.27 0.27 (CaO + SrO + BaO)/Al₂O₃ 0.88 0.87 0.88 0.83 0.86 0.86 0.9 0.9 CaO/(CaO + SrO) 0.81 0.82 0.81 0.82 0.73 0.77 0.8 0.82 CTE (×10⁻⁷/° C.) 35.6 35.7 35.9 35.8 35.5 35.5 35.7 density (g/cm³) 2.556 2.57 2.57 2.574 2.566 2.562 2.552 2.552 strain point (° C.) 719.8 723.2 720.8 724.6 723.1 718.6 719.6 annealing point (° C.) 773 776.3 771.9 777.5 775.3 771.9 773.1 Young's modulus (GPa) 79.6 80.4 79.8 82.1 81.1 80 79.8 T at 200 poise (° C.) 1679 1678 1674 1661 1664 1661 1682 1679 T at 35000 poise (° C.) 1283 1283 1281 1276 1277 1274 1285 1282 liquidus temperature (° C.) 1160 1160 1150 1170 1170 1160 1180 1180 liquidus viscosity (poise) 4.9E+05 5.0E+05 6.1E+05 3.4E+05 3.5E+05 4.2E+05 3.1E+05 3.0E+05 T_(35k) − T_(liq) 123 123 131 106 107 114 105 102 0.25T_(35k) − 225 95.75 95.75 95.25 94 94.25 93.5 96.25 95.5 Example 65 66 67 68 69 70 71 72 SiO₂ 70.64 70.67 70.44 69.93 70.43 70.48 69.69 71.22 Al₂O₃ 11.55 11.52 11.67 11.93 11.57 11.46 11.45 11.67 B₂O₃ 3.41 3.41 3.28 3.26 3.27 3.13 2.22 1.7 MgO 3.55 3.47 3.82 4.41 4.14 4.21 5.75 4.85 CaO 5.43 5.49 5.51 5.74 5.51 5.45 6.11 5.31 SrO 1.24 1.14 1.24 1.86 1.27 1.24 1 1.15 BaO 4.06 4.18 3.92 2.73 3.7 3.91 3.64 3.97 SnO₂ 0.09 0.09 0.09 0.1 0.09 0.09 0.12 0.1 Fe₂O₃ 0.01 0.01 0.01 0.01 0.01 0.01 0.01 0.01 ZrO₂ 0.02 0.02 0.02 0.02 0.01 0.01 0.02 0.02 (MgO + CaO + SrO + BaO)/Al₂O₃ 1.24 1.24 1.24 1.24 1.26 1.29 1.44 1.31 MgO/(MgO + CaO + SrO + BaO) 0.25 0.24 0.26 0.3 0.28 0.28 0.35 0.32 (CaO + SrO + BaO)/Al₂O₃ 0.93 0.94 0.91 0.87 0.91 0.92 0.94 0.89 CaO/(CaO + SrO) 0.81 0.83 0.82 0.76 0.81 0.81 0.86 1 CTE (×10⁻⁷/° C.) 36.1 37.6 36.5 36.2 35.9 36.9 37.8 36.4 density (g/cm³) 2.588 2.591 2.576 2.568 2.58 2.59 2.604 2.602 strain point (° C.) 719 718.8 719.9 721.9 722.9 721.9 738.5 annealing point (° C.) 771.2 772.5 772.7 774.1 774.4 774 790.9 Young's modulus (GPa) 79.2 78.9 80.2 81.1 80.5 80.9 81.9 T at 200 poise (° C.) 1690 1692 1683 1663 1679 1681 1651 1693 T at 35000 poise (° C.) 1289 1289 1286 1276 1283 1284 1269 1296 liquidus temperature (° C.) 1160 1150 1150 1170 1155 1160 1165 1175 liquidus viscosity (poise) 5.5E+05 7.1E+05 6.7E+05 3.4E+05 5.6E+05 5.1E+05 3.4E+05 4.9E+05 T_(35k) − T_(liq) 129 139 136 106 128 124 104 121 0.25T_(35k) − 225 97.25 97.25 96.5 94 95.75 96 92.25 99 Example 73 74 75 76 77 78 79 80 SiO₂ 71.48 71.19 71.48 71.59 71.49 69.6 69.83 70.26 Al₂O₃ 11.36 11.59 11.58 11.55 11.57 11.37 11.33 11.78 B₂O₃ 1.45 1.55 1.52 1.53 1.61 1.99 1.79 3.4 MgO 4.87 5.02 4.53 4.33 4.4 5.82 5.82 4.44 CaO 5.35 5.44 5.43 5.52 5.45 6.15 6.15 5.49 SrO 0.98 1.21 1.37 1.29 1.22 0.35 0.34 1.25 BaO 4.38 3.86 3.96 4.04 4.12 4.55 4.58 3.29 SnO₂ 0.1 0.1 0.1 0.1 0.1 0.13 0.13 0.08 Fe₂O₃ 0.01 0.01 0.01 0.01 0.01 0.01 0.01 0.01 ZrO₂ 0.02 0.02 0.02 0.02 0.02 0.02 0.02 0.01 (MgO + CaO + SrO + BaO)/Al₂O₃ 1.37 1.34 1.32 1.31 1.31 1.48 1.49 1.23 MgO/(MgO + CaO + SrO + BaO) 0.31 0.32 0.30 0.29 0.29 0.34 0.34 0.31 (CaO + SrO + BaO)/Al₂O₃ 0.94 0.91 0.93 0.94 0.93 0.97 0.98 0.85 CaO/(CaO + SrO) 1 1 1 1 1 0.95 0.95 0.81 CTE (×10⁻⁷/° C.) 37.1 36.9 36.9 36.7 37 38.4 38.1 35.3 density (g/cm³) 2.617 2.605 2.608 2.609 2.61 2.623 2.626 2.568 strain point (° C.) 737.4 740.7 741.3 740.1 741.9 725.8 726.3 722.8 annealing point (° C.) 789.7 791.6 792.7 793.2 794.7 775.9 777.8 774.4 Young's modulus (GPa) 82 83 82.2 81.8 80.9 82.3 83 80.7 T at 200 poise (° C.) 1699 1690 1699 1703 1701 1654 1658 1672 T at 35000 poise (° C.) 1299 1295 1300 1302 1301 1271 1274 1280 liquidus temperature (° C.) 1200 1190 1185 1180 1180 1165 1170 1170 liquidus viscosity (poise) 2.9E+05 3.2E+05 4.4E+05 4.7E+05 4.9E+05 3.5E+05 3.3E+05 3.7E+05 T_(35k) − T_(liq) 99 105 115 122 121 106 104 110 0.25T_(35k) − 225 99.75 98.75 100 100.5 100.25 92.75 93.5 95 Example 81 82 83 84 85 86 87 88 SiO₂ 69.89 69.7 70.13 70.01 70.1 69.72 69.85 69.31 Al₂O₃ 11.82 11.93 11.93 12 11.94 12.05 11.52 11.6 B₂O₃ 3.38 3.27 3.31 2.99 2.93 3.06 2.41 2.2 MgO 4.29 4.8 4.19 4.64 4.75 4.77 5.37 5.78 CaO 5.57 5.74 5.48 5.67 5.73 5.76 6.06 6.19 SrO 1.25 1.24 1.22 1.21 1.2 1.21 1.37 1.27 BaO 3.68 3.19 3.61 3.35 3.23 3.3 3.28 3.54 SnO₂ 0.08 0.1 0.09 0.09 0.09 0.09 0.11 0.08 Fe₂O₃ 0.01 0.01 0.01 0.01 0.01 0.01 0.01 0.01 ZrO₂ 0.01 0.02 0.02 0.02 0.02 0.02 0.02 0.02 (MgO + CaO + SrO + BaO)/Al₂O₃ 1.25 1.25 1.22 1.24 1.25 1.25 1.4 1.45 MgO/(MgO + CaO + SrO + BaO) 0.29 0.32 0.29 0.31 0.32 0.32 0.33 0.34 (CaO + SrO + BaO)/Al₂O₃ 0.89 0.85 0.86 0.85 0.85 0.85 0.93 0.95 CaO/(CaO + SrO) 0.82 0.82 0.82 0.82 0.83 0.83 0.82 0.83 CTE (×10⁻⁷/° C.) 36.4 35.9 35.9 36 35.7 37 density (g/cm³) 2.583 2.572 2.578 2.578 2.565 2.581 2.595 2.61 strain point (° C.) 720.8 723.2 724 727.2 726.6 725.4 724.4 725 annealing point (° C.) 773.5 775.4 775.9 778.3 779.3 777.8 774.7 774.6 Young's modulus (GPa) 80.5 81.2 75.3 80.9 80.9 80.8 82.3 83.2 T at 200 poise (° C.) 1668 1658 1675 1667 1667 1660 1655 1642 T at 35000 poise (° C.) 1277 1273 1282 1279 1279 1274 1272 1264 liquidus temperature (° C.) 1150 1150 1160 1165 1165 1165 1160 1160 liquidus viscosity (poise) 5.7E+05 5.2E+05 4.9E+05 4.1E+05 4.1E+05 3.8E+05 4.0E+05 3.5E+05 T_(35k) − T_(liq) 127 123 122 114 114 109 112 104 0.25T_(35k) − 225 94.25 93.25 95.5 94.75 94.75 93.5 93 91 Example 89 90 91 92 93 94 95 96 SiO₂ 69.41 71.05 71.48 70.14 70.61 69.88 69.85 69.46 Al₂O₃ 11.58 11.61 11.77 12 11.93 11.89 11.89 11.49 B₂O₃ 2.17 0.95 1.55 3.53 4.15 3.27 3.3 2.23 MgO 5.75 5.28 4.46 4.15 3.4 4.47 4.47 5.86 CaO 6.18 5.81 5.52 5.47 6.03 5.8 5.77 6.09 SrO 1.29 0.91 1.14 1.22 1.28 1.97 1.87 0.37 BaO 3.5 4.28 3.96 3.38 2.5 2.59 2.71 4.32 SnO₂ 0.09 0.1 0.09 0.09 0.08 0.09 0.1 0.13 Fe₂O₃ 0.01 0.01 0.01 0.01 0.01 0.01 0.01 0.01 ZrO₂ 0.02 0.01 0.01 0.02 0.01 0.02 0.02 0.02 (MgO + CaO + SrO + BaO)/Al₂O₃ 1.44 1.40 1.28 1.19 1.11 1.25 1.25 1.45 MgO/(MgO + CaO + SrO + BaO) 0.34 0.32 0.30 0.29 0.26 0.3 0.3 0.35 (CaO + SrO + BaO)/Al₂O₃ 0.95 0.95 0.90 0.84 0.82 0.87 0.87 0.94 CaO/(CaO + SrO) 0.83 1 1 0.82 0.82 0.75 0.76 0.94 CTE (×10⁻⁷/° C.) 37.6 36.7 35.7 33.7 35.8 35.8 density (g/cm³) 2.607 2.624 2.608 2.569 2.529 2.567 2.568 2.616 strain point (° C.) 723.7 744.7 743.1 722.2 721 721.1 720.7 722.6 annealing point (° C.) 775.2 795.3 795.5 775.5 773.1 773.6 772.1 774.4 Young's modulus (GPa) 82.9 81.9 80.3 79.5 80.8 81.2 82.7 T at 200 poise (° C.) 1644 1684 1700 1674 1680 1660 1660 1651 T at 35000 poise (° C.) 1266 1293 1301 1281 1284 1274 1274 1269 liquidus temperature (° C.) 1160 1170 1170 1160 1200 1180 1180 1180 liquidus viscosity (poise) 3.6E+05 5.5E+05 6.1E+05 4.8E+05 2.0E+05 2.6E+05 2.6E+05 2.3E+05 T_(35k) − T_(liq) 106 123 131 121 84 94 94 89 0.25T_(35k) − 225 91.5 98.25 100.25 95.25 96 93.5 93.5 92.25 Example 97 98 99 SiO₂ 69 69.47 69.46 Al₂O₃ 11.61 11.58 11.57 B₂O₃ 2.29 2.23 2.17 MgO 6.01 5.68 5.76 CaO 6.31 6.15 6.17 SrO 1.03 1.29 1.29 BaO 3.6 3.49 3.47 SnO₂ 0.11 0.09 0.09 Fe₂O₃ 0.01 0.01 0.01 ZrO₂ 0.03 0.02 0.02 (MgO + CaO + SrO + BaO)/Al₂O₃ 1.46 1.43 1.44 MgO/(MgO + CaO + SrO + BaO) 0.35 0.34 0.35 (CaO + SrO + BaO)/Al₂O₃ 0.94 0.94 0.94 CaO/(CaO + SrO) 0.86 0.83 0.83 CTE (×10⁻⁷/° C.) 37.8 density (g/cm³) 2.609 2.606 2.606 strain point (° C.) 721.2 724.3 723.9 annealing point (° C.) 772.8 775.4 775.5 Young's modulus (GPa) 83 T at 200 poise (° C.) 1635 1645 1645 T at 35000 poise (° C.) 1260 1267 1266 liquidus temperature (° C.) 1175 1170 1170 liquidus viscosity (poise) 2.2E+05 2.8E+05 2.8E+05 T_(35k) − T_(liq) 85 97 96 0.25T_(35k) − 225 90 91.75 91.5

Table 2 shows examples of glasses that fall outside of the disclosed ranges. Examples 5-8 have (MgO+CaO+SrO+BaO)/Al₂O₃≦1.05, and show both mullite as the liquidus phase and unacceptably low T_(35k)−T_(liq). Other examples have concentrations of specific oxide components that lie outside the disclosed ranges, and likewise show unacceptable T_(35k)−T_(liq)

TABLE 2 Mol % 1 2 3 4 5 SiO₂ 71.59 72.09 70.99 71.2 70.54 Al₂O₃ 11.74 10.81 11.8 11.59 13.29 B₂O₃ 1.99 0 1.2 1.19 2.72 MgO 4.17 5.34 5.57 5.32 3.49 CaO 5.29 5.84 5.36 5.36 4.55 SrO 2.56 1.52 1.84 1.4 1.1 BaO 2.53 4.22 3.08 3.78 4.18 SnO₂ 0.11 0.14 0.11 0.11 0.1 Fe₂O₃ 0.01 0.02 0.02 0.02 0.01 ZrO₂ 0.01 0.02 0.03 0.02 0.02 Sb₂O₃ RO/Al₂O₃ 1.239352641 1.565217391 1.343220339 1.36842105 1.00225734 MgO/RO 0.286597938 0.315602837 0.351419558 0.33543506 0.26201201 (Ca,Sr,Ba)O/Al₂O₃ 0.713402062 0.684397163 0.648580442 0.66456494 0.73798799 CaO/(CaO + SrO) 0.67388535 0.793478261 0.744444444 0.79289941 0.80530973 Properties anneal (fiber) 793 801 796 797 796 soft 1037.9 1043 1034.1 1038.6 1040.9 CTE (fiber) 35.9 39.8 36.1 36.5 34.8 density 2.574 2.645 2.6 2.612 2.596 strain (BBV) 739.9 748.6 744.3 743 743.3 anneal (BBV) 793.1 798.7 795.7 795.1 795.7 1012 (BBV) 833.7 834.9 836.1 836 833.3 soft (PPV) 1035.5 1043.4 1030.9 1031.3 1034.1 CTE (curve, 37.4 40.7 37.8 38.2 34.9 heating) CTE (curve, 36.9 40.6 36.5 37.1 35.2 cooling) Poisson ratio 0.224 0.228 0.231 0.24 0.227 Shear Modulus 4.847 4.927 4.895 4.873 4.783 (Mpsi) Young's modulus 11.87 12.098 12.051 12.083 11.738 (Mpsi) Young's modulus 81.8 83.4 83.1 83.3 80.9 (GPa) specific modulus 31.8 31.5 32 31.9 31.2 Mol % 6 7 8 9 SiO₂ 70.61 70.21 70.4 70.74 Al₂O₃ 13.13 13.27 13.25 12.25 B₂O₃ 2.73 2.57 2.52 2.3 MgO 3.38 3.51 3.41 4.26 CaO 4.65 4.82 4.58 4.93 SrO 1.25 1.24 1.42 1.26 BaO 4.12 4.24 4.29 4.12 SnO₂ 0.1 0.1 0.1 0.11 Fe₂O₃ 0.01 0.01 0.01 0.01 ZrO₂ 0.02 0.02 0.02 0.02 Sb₂O₃ RO/Al₂O₃ 1.02056359 1.04069329 1.03396226 1.18938776 MgO/RO 0.25223881 0.25416365 0.24890511 0.29238161 (Ca,Sr,Ba)O/Al₂O₃ 0.74776119 0.74583635 0.75109489 0.70761839 CaO/(CaO + SrO) 0.78813559 0.79537954 0.76333333 0.79644588 Properties anneal (fiber) 796 796 793 soft 1041.7 1039.4 1044 CTE (fiber) 35.6 35.9 density 2.598 2.606 2.606 2.605 strain (BBV) 738.7 742.1 744.6 739.1 anneal (BBV) 792.7 794.7 796.5 791.7 1012 (BBV) 830.7 832.4 834.1 831.8 soft (PPV) 1040 1040 1042.9 1036 CTE (curve, heating) 35.4 37.5 36.3 36.8 CTE (curve, cooling) 35.2 36.3 35.6 36.5 Poisson ratio 0.232 0.235 0.229 0.228 Shear Modulus (Mpsi) 4.76 4.789 4.786 4.789 Young's modulus 11.727 11.83 11.763 11.766 (Mpsi) Young's modulus (GPa) 80.9 81.6 81.1 81.1 specific modulus 31.1 31.3 31.1 31.1

Various modifications and variations can be made to the materials, methods, and articles described herein. Other aspects of the materials, methods, and articles described herein will be apparent from consideration of the specification and practice of the materials, methods, and articles disclosed herein. It is intended that the specification and examples be considered as exemplary. 

What is claimed is:
 1. A method for producing glass sheets comprising selecting each of the raw materials to be employed in producing the glass sheets and melting and fining the selected raw materials so that the glass making up the sheets is substantially free of alkali metals and comprises, in mole percent on an oxide basis: SiO₂ 69-72.5 Al₂O₃ 11-13.5 B₂O₃ 1-5 MgO 3-5 CaO 4-6.5 SrO 0-3 BaO 1.5-5 where SiO₂, Al₂O₃, B₂O₃, MgO, CaO, SrO and BaO represent the mole percents of the oxide components, wherein: (i) said selecting each of the raw materials to be employed in producing the glass sheets comprises selecting a raw material that comprises between 0 and 200 ppm sulfur by weight; and (ii) said method comprises deliberately controlling tramp sulfur from raw materials through said selecting of each raw material to comprise between 0 and 200 ppm sulfur by weight.
 2. The method of claim 1 wherein the glass making up the glass sheets comprises 0.01 to 0.4 mol % of any one of or a combination of SnO₂, As₂O₃, Sb₂O₃, F, Cl or Br as a chemical fining agent.
 3. The method of claim 1 wherein the glass making up the glass sheets comprises 0.005 to 0.2 mol % of any one of or a combination of Fe₂O₃, CeO₂, or MnO₂ as a chemical fining agent.
 4. The method of claim 1 wherein the glass making up the glass sheets comprises at most 0.05 mol % Sb₂O₃.
 5. The method of claim 1 wherein the glass making up the glass sheets comprises at most 0.005 mol % As₂O₃ and at most 0.005 mol % Sb₂O₃.
 6. The method of claim 1 wherein the glass making up the glass sheets has an annealing point greater than 785° C.
 7. The method of claim 1 wherein the glass making up the glass sheets satisfies the relationship: T _(35k) −T _(liq)>0.25T _(35k)−225° C., where T_(liq) is the liquidus temperature of the glass and T_(35k) is the temperature at which the glass has a viscosity of 35,000 poise.
 8. The method of claim 1 wherein the glass sheets are formed by a downdraw process.
 9. A method of producing liquid crystal displays comprising manufacturing thin film transistors on substrates that comprise glass sheets produced by the method of claim
 1. 10. A method for producing glass sheets comprising selecting each of the raw materials to be employed in producing the glass sheets and melting and fining the selected raw materials so that the glass making up the sheets comprises SiO₂, Al₂O₃, B₂O₃, MgO, CaO and BaO, and, on an oxide basis, has: (i) a (MgO+CaO+SrO+BaO)/Al₂O₃ ratio greater than or equal to 1.05; (ii) a MgO content greater than or equal to 3.0 mole percent; (iii) a CaO content greater than or equal to 4.0 mole percent; and (iv) a BaO content greater than or equal to 1.5 mole percent, wherein: (a) the glass making up the sheets is substantially free of alkali metals, (b) the fining is performed without the use of substantial amounts of arsenic, (c) said selecting of each of the raw materials employed in producing the glass sheets comprises selecting a raw material that comprises between 0 and 200 ppm sulfur by weight, and (d) said method comprises deliberately controlling tramp sulfur from raw materials through said selecting of each raw material to comprise between 0 and 200 ppm sulfur by weight.
 11. The method of claim 10 wherein the fining is performed without the use of substantial amounts of antimony.
 12. The method of claim 10 wherein a population of 50 sequential glass sheets produced from the melted and fined raw materials has an average gaseous inclusion level of less than 0.10 gaseous inclusions/cubic centimeter, where each sheet in the population has a volume of at least 500 cubic centimeters.
 13. The method of claim 10 wherein the glass sheets are formed by a downdraw process.
 14. A method of producing liquid crystal displays comprising manufacturing thin film transistors on substrates that comprise glass sheets produced by the method of claim
 10. 15. A method for producing glass sheets comprising selecting each of the raw materials to be employed in producing the glass sheets and melting and fining the selected raw materials so that glass making up the sheets comprises SiO₂, Al₂O₃, B₂O₃, MgO, CaO and BaO, and, on an oxide basis, has a BaO content greater than or equal to 1.5 mole percent, wherein: (a) the glass making up the sheets is substantially free of alkali metals, (b) the fining is performed without the use of substantial amounts of arsenic, (c) said selecting of each of the raw materials to be employed in producing the glass sheets comprises selecting a raw material that comprises between 0 and 200 ppm sulfur by weight, and (d) said method comprises deliberately controlling tramp sulfur from raw materials through said selecting of each raw material to comprise between 0 and 200 ppm sulfur by weight.
 16. The method of claim 15 wherein the fining is performed without the use of substantial amounts of antimony.
 17. The method of claim 15 wherein a population of 50 sequential glass sheets produced from the melted and fined raw materials has an average gaseous inclusion level of less than 0.10 gaseous inclusions/cubic centimeter, where each sheet in the population has a volume of at least 500 cubic centimeters.
 18. The method of claim 15 wherein the glass sheets are formed by a downdraw process.
 19. A method of producing liquid crystal displays comprising manufacturing thin film transistors on substrates that comprise glass sheets produced by the method of claim
 15. 